Microscopy and scanning electron microscopic analysis (SEM) on request incl. EDX ( punctual half-quantum chemical analysis / element mapping)

Test Procedure:

FGK-work specification “Rasterelektronenmikroskopie”

Specification for samples:

Sample size max. 50 x 50 mm², sample height max. 50 mm


The service catalog contains all offered tests and analyses in alphabetical order. For tests outside the directory of services as well as activities in the areas of research and development and consulting, we would be pleased to make you an offer.

We always try to process your orders in the shortest possible time. Please inform us, if you have special date desires.

You will receive your test reports by e-mail (pdf) as valid original copies immediately after finishing the work.